90
|
NanoLab Inc
cross sectional sem using focused ion beam milling (fib) Cross Sectional Sem Using Focused Ion Beam Milling (Fib), supplied by NanoLab Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/cross+sectional+sem+using+focused+ion+beam+milling+(fib)/cross+sectional+sem+using+focused+ion+beam+milling++fib+/pm29939717-66-3-18 Average 90 stars, based on 1 article reviews
cross sectional sem using focused ion beam milling (fib) - by Bioz Stars,
2026-10
90/100 stars
|
Buy from Supplier |